Transactions of Nanjing University of Aeronautics & Astronautics
Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage
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Abstract:
Because of the inevitable debugging lag, imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model. Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely, by hybridizing testing-effort with testing coverage under imperfect debugging, this paper proposes a new model named GMW-LO-ID. Under the assumption that the number of faults is proportional to the current number of detected faults, this model combines generalized modified Weibull (GMW) testing-effort function with logistic (LO) testing coverage function, and inherits GMW's amazing flexibility and LO's high fitting precision. Furthermore, the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models, which only consider one or two points of testing-effort, testing coverage and imperfect debugging.
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This work was supported by the National Natural Science Foundation of China (No.U1433116) and the Aviation Science Foundation of China (No.20145752033).
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